• DocumentCode
    3288933
  • Title

    Developments in delay testing

  • Author

    Savir, Jacob

  • Author_Institution
    IBM, Poughkeepsie, NY, USA
  • fYear
    1992
  • fDate
    7-9 April 1992
  • Firstpage
    247
  • Lastpage
    253
  • Abstract
    The author´s objective is to introduce the reader to the fast emerging field of AC test for digital logic circuits. He includes a brief discussion of the important concepts, algorithms and circuits that are used in conjunction with AC test. A comprehensive bibliography is provided.<>
  • Keywords
    delays; fault location; logic testing; AC test; delay testing; digital logic circuits; Circuit faults; Circuit testing; Clocks; Delay effects; Hazards; Jacobian matrices; Logic circuits; Propagation delay; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-7803-0623-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1992.232760
  • Filename
    232760
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3288933