Title :
An analysis of dynamic element matching techniques in sigma-delta modulation
Author :
Nys, O.J.A.P. ; Henderson, R.K.
Author_Institution :
Swiss Center for Electron. & Microtechnol., Neuchatel, Switzerland
Abstract :
A mathematical model of mismatch noise in an oversampled DAC is established for two important dynamic element matching techniques. The noise shaping of the data weighted averaging method is proven to be first order. Analytical predictions of converter resolution can be made from array size, mismatch variance and oversampling ratio
Keywords :
circuit noise; digital-analogue conversion; sigma-delta modulation; array size; converter resolution; data weighted averaging method; dynamic element matching techniques; mathematical model; mismatch noise; mismatch variance; noise shaping; oversampled DAC; oversampling ratio; sigma-delta modulation; Analysis of variance; Capacitors; Data conversion; Delta modulation; Delta-sigma modulation; Linearity; Mathematical model; Noise shaping; Quantization; Signal resolution;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.539871
