Built-in current self-testing scheme (BICST) for CMOS logic circuits

Author

Tong, Qiao Carol

Author_Institution

Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA

fYear

1992

fDate

7-9 April 1992

Firstpage

304

Lastpage

308

Abstract

A novel scheme for built-in self-testing used in current testing environment (named BICST) is presented in this paper. Test vectors are generated on chip in BICST to detect the stuck-on and bridging faults as well as stuck-at faults in a CMOS circuit. The test set generated by pseudo-exhaustive testing method can detect stuck-on and bridging faults that cause abnormal large current flow in the circuit, which will be caught by the built-in current sensors. Partitioning is done for pseudo-exhaustive testing and to obtain high resolution in current measuring. The overall structure of the BICST system is also presented.<>

Keywords

CMOS integrated circuits; built-in self test; fault location; integrated circuit testing; integrated logic circuits; logic testing; CMOS logic circuits; IDDQ testing; bridging faults; built-in current sensors; built-in self-testing; current self-testing scheme; onchip test vectors; partitioning; pseudo-exhaustive testing; quiescent power supply current; stuck-on faults; Automatic testing; Built-in self-test; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE

Conference_Location

Atlantic City, NJ, USA

Print_ISBN

0-7803-0623-6

Type

conf

DOI

10.1109/VTEST.1992.232770

Filename

232770