• DocumentCode
    3289136
  • Title

    Algorithms for the design verification of bipolar array chips

  • Author

    Zein, David A. ; Engel, Oliver P. ; Ditlow, Gary

  • fYear
    1992
  • fDate
    7-9 April 1992
  • Firstpage
    327
  • Lastpage
    332
  • Abstract
    A new methodology is used for the design verification of bipolar array chips. Here the authors apply analog methods to verify the logic function of the chip´s basic circuits or macromodels and the noise margins. They also check for reliability by computing the current density at each device contact stud. The logic paths are implicitly verified. Several algorithms are used as building blocks in an implementation program. This includes a recursive scheduling algorithm, a Gray algorithm and an algorithm to treat differential pairs. A nonlinear Gauss-Seidel method for decoupling and solving a nonlinear set of algebraic equations is described.<>
  • Keywords
    bipolar integrated circuits; circuit CAD; circuit reliability; logic CAD; logic arrays; scheduling; Gray algorithm; algebraic equations; analog methods; bipolar array chips; current density; design verification; differential pairs; logic synthesis; macromodels; noise margins; nonlinear Gauss-Seidel method; nonlinear set; recursive scheduling algorithm; reliability; Algorithm design and analysis; Circuit noise; Circuit simulation; Current density; Libraries; Logic arrays; Logic devices; Logic functions; Scheduling algorithm; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-7803-0623-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1992.232774
  • Filename
    232774