DocumentCode :
3289136
Title :
Algorithms for the design verification of bipolar array chips
Author :
Zein, David A. ; Engel, Oliver P. ; Ditlow, Gary
fYear :
1992
fDate :
7-9 April 1992
Firstpage :
327
Lastpage :
332
Abstract :
A new methodology is used for the design verification of bipolar array chips. Here the authors apply analog methods to verify the logic function of the chip´s basic circuits or macromodels and the noise margins. They also check for reliability by computing the current density at each device contact stud. The logic paths are implicitly verified. Several algorithms are used as building blocks in an implementation program. This includes a recursive scheduling algorithm, a Gray algorithm and an algorithm to treat differential pairs. A nonlinear Gauss-Seidel method for decoupling and solving a nonlinear set of algebraic equations is described.<>
Keywords :
bipolar integrated circuits; circuit CAD; circuit reliability; logic CAD; logic arrays; scheduling; Gray algorithm; algebraic equations; analog methods; bipolar array chips; current density; design verification; differential pairs; logic synthesis; macromodels; noise margins; nonlinear Gauss-Seidel method; nonlinear set; recursive scheduling algorithm; reliability; Algorithm design and analysis; Circuit noise; Circuit simulation; Current density; Libraries; Logic arrays; Logic devices; Logic functions; Scheduling algorithm; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
Type :
conf
DOI :
10.1109/VTEST.1992.232774
Filename :
232774
Link To Document :
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