DocumentCode
3289136
Title
Algorithms for the design verification of bipolar array chips
Author
Zein, David A. ; Engel, Oliver P. ; Ditlow, Gary
fYear
1992
fDate
7-9 April 1992
Firstpage
327
Lastpage
332
Abstract
A new methodology is used for the design verification of bipolar array chips. Here the authors apply analog methods to verify the logic function of the chip´s basic circuits or macromodels and the noise margins. They also check for reliability by computing the current density at each device contact stud. The logic paths are implicitly verified. Several algorithms are used as building blocks in an implementation program. This includes a recursive scheduling algorithm, a Gray algorithm and an algorithm to treat differential pairs. A nonlinear Gauss-Seidel method for decoupling and solving a nonlinear set of algebraic equations is described.<>
Keywords
bipolar integrated circuits; circuit CAD; circuit reliability; logic CAD; logic arrays; scheduling; Gray algorithm; algebraic equations; analog methods; bipolar array chips; current density; design verification; differential pairs; logic synthesis; macromodels; noise margins; nonlinear Gauss-Seidel method; nonlinear set; recursive scheduling algorithm; reliability; Algorithm design and analysis; Circuit noise; Circuit simulation; Current density; Libraries; Logic arrays; Logic devices; Logic functions; Scheduling algorithm; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232774
Filename
232774
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