Title :
How to employ multi-GHz analog and RF modules in open architecture ATE
Author :
Rajsuman, Rochit ; Kushnic, Eric ; Perez, Sergio
Author_Institution :
Advantest America R&D Center, Santa Clara, CA, USA
Abstract :
Open architecture ATE is a multi-site, reconfigurable, modularized test system that supports third party modules in a plug-and-play manner. When high-speed analog/mixed-signal modules are used with digital module from different vendors, synchronization of these modules present unique engineering challenges. In this paper we describe a synchronization method when RF and mixed-signal modules are used in open architecture ATE.
Keywords :
automatic test equipment; integrated circuit testing; synchronisation; RF modules; digital module; high-speed analog modules; mixed-signal modules; modularized test system; modules synchronization; multiGHz analog modules; multisite test system; open architecture ATE; plug-and-play manner; reconfigurable test system; synchronization method; third party modules; Circuit testing; Communication system control; Computer architecture; Control systems; Costs; Electronic equipment testing; Hardware; Radio frequency; Software testing; System testing;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
Print_ISBN :
0-7803-8582-9
DOI :
10.1109/IEMT.2004.1321661
