DocumentCode
3289348
Title
A comparison of structural test approaches
Author
Pateras, Stephen
Author_Institution
Logic Vision, San Jose, CA, USA
fYear
2004
fDate
July 14-16, 2004
Firstpage
206
Lastpage
211
Abstract
Structural logic test approaches fall into two major camps: ATPG and BIST. There have been a lot of discussions/articles lately on these two methodologies, including so-called ATPG compression techniques. The proposed paper provides a detailed comparison of these methodologies using various metrics including such factors as test quality, test time, and diagnostic ability. The comparison includes both analytical as well as quantitative analysis using industry published data.
Keywords
automatic test pattern generation; built-in self test; logic testing; ATPG compression; BIST; analytical analysis; diagnostic ability; quantitative analysis; structural logic test; structural test approaches; test quality; test time; Automatic test pattern generation; Built-in self-test; Circuit testing; Clocks; Crosstalk; Integrated circuit interconnections; Logic testing; Pins; Routing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
ISSN
1089-8190
Print_ISBN
0-7803-8582-9
Type
conf
DOI
10.1109/IEMT.2004.1321663
Filename
1321663
Link To Document