Title :
A comparison of structural test approaches
Author :
Pateras, Stephen
Author_Institution :
Logic Vision, San Jose, CA, USA
Abstract :
Structural logic test approaches fall into two major camps: ATPG and BIST. There have been a lot of discussions/articles lately on these two methodologies, including so-called ATPG compression techniques. The proposed paper provides a detailed comparison of these methodologies using various metrics including such factors as test quality, test time, and diagnostic ability. The comparison includes both analytical as well as quantitative analysis using industry published data.
Keywords :
automatic test pattern generation; built-in self test; logic testing; ATPG compression; BIST; analytical analysis; diagnostic ability; quantitative analysis; structural logic test; structural test approaches; test quality; test time; Automatic test pattern generation; Built-in self-test; Circuit testing; Clocks; Crosstalk; Integrated circuit interconnections; Logic testing; Pins; Routing; Timing;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
Print_ISBN :
0-7803-8582-9
DOI :
10.1109/IEMT.2004.1321663
