DocumentCode
3289507
Title
Variation of elevation angle and total electron content (TEC) and profile shape using Modified Jones 3D Ray Tracing for differential Global Positioning System (dGPS) in equatorial
Author
Ya´acob, Norsuzila ; Abdullah, Mardina ; Ismail, Mahamod ; Zulkifli, Siti Sarah Nik
Author_Institution
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi
fYear
2008
fDate
2-4 Dec. 2008
Firstpage
381
Lastpage
385
Abstract
The difference in ionospheric delay between paths to the reference and mobile stations for differential GPS has been quantified for equatorial region. This small additional ionospheric error can be evaluated and predicted for the mobile station by means of a determined differential delay along the baseline so that accurate correction can be made for the most precise positioning. In this paper we studies the ionospheric delay on the Global Positioning System (GPS) signal due to the variation of elevation angle and variation in total electron content (TEC) and ionospheric profiles utilizing the Modified Jones 3D Ray Tracing method. The differential delay can be determined for any azimuth angle of propagation and for any baseline direction, providing the approximate difference in line-of-sight (LOS) between the stations. Result show that the variations of elevation angle and TEC give effects on the difference in delay between the two stations in differential GPS (dGPS). This analysis determined the difference in ionospheric delay expected over a short baseline so that a more accurate differential GPS correction can be made.
Keywords
Global Positioning System; delays; ionospheric electromagnetic wave propagation; ray tracing; differential Global Positioning System; differential delay; elevation angle; ionospheric delay; modified Jones 3D ray tracing; profile shape; total electron content; Conference proceedings; Delay effects; Electrons; Geomagnetism; Global Positioning System; Ionosphere; Radio frequency; Ray tracing; Satellites; Shape; Global Positioning System (GPS); Ionosphere; Line of sight (LOS); Total Electron Content (TEC); ray tracing;
fLanguage
English
Publisher
ieee
Conference_Titel
RF and Microwave Conference, 2008. RFM 2008. IEEE International
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-2866-3
Electronic_ISBN
978-1-4244-2867-0
Type
conf
DOI
10.1109/RFM.2008.4897384
Filename
4897384
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