DocumentCode
3289528
Title
Silicon debug: avoid needles respins
Author
De Boer, Wilco ; Vermeulen, Bart
Author_Institution
Philips Res. Labs., Eindhoven, Netherlands
fYear
2004
fDate
July 14-16, 2004
Firstpage
277
Lastpage
281
Abstract
For large and complex SoCs, existing techniques such as simulation, formal verification, static timing analysis and signal integrity analysis cannot guarantee silicon to be 100% functionally correct first time. Each remaining design error after first tape-out must be found as quickly as possible. Philips developed a structured approach to debug multiple-clock SoC designs in prototype application boards or on digital IC testers. The approach consists of an on-chip debug infrastructure and supporting debugger software. The debugger software interacts with the on-chip infrastructure to make the chip state observable and controllable. In this paper, we describe our silicon debug approach and we include results on the application of our debugging system to two large system chips: the Philips Nexperia™ Home Entertainment engine and the first generation Philips Nexperia™ CODEC SoC.
Keywords
automatic test software; integrated circuit testing; silicon; system-on-chip; Philips Nexperia™ CODEC SoC; Philips Nexperia™ Home Entertainment; Si; SoCs; debugger software; design debugging; digital IC testers; formal verification; multiple-clock SoC design; on-chip debug infrastructure; prototype application boards; respin; signal integrity analysis; silicon debug; simulation; static timing analysis; Analytical models; Application software; Formal verification; Needles; Prototypes; Signal analysis; Silicon; Software debugging; Software prototyping; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
ISSN
1089-8190
Print_ISBN
0-7803-8582-9
Type
conf
DOI
10.1109/IEMT.2004.1321676
Filename
1321676
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