Title :
Silicon debug: avoid needles respins
Author :
De Boer, Wilco ; Vermeulen, Bart
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Abstract :
For large and complex SoCs, existing techniques such as simulation, formal verification, static timing analysis and signal integrity analysis cannot guarantee silicon to be 100% functionally correct first time. Each remaining design error after first tape-out must be found as quickly as possible. Philips developed a structured approach to debug multiple-clock SoC designs in prototype application boards or on digital IC testers. The approach consists of an on-chip debug infrastructure and supporting debugger software. The debugger software interacts with the on-chip infrastructure to make the chip state observable and controllable. In this paper, we describe our silicon debug approach and we include results on the application of our debugging system to two large system chips: the Philips Nexperia™ Home Entertainment engine and the first generation Philips Nexperia™ CODEC SoC.
Keywords :
automatic test software; integrated circuit testing; silicon; system-on-chip; Philips Nexperia™ CODEC SoC; Philips Nexperia™ Home Entertainment; Si; SoCs; debugger software; design debugging; digital IC testers; formal verification; multiple-clock SoC design; on-chip debug infrastructure; prototype application boards; respin; signal integrity analysis; silicon debug; simulation; static timing analysis; Analytical models; Application software; Formal verification; Needles; Prototypes; Signal analysis; Silicon; Software debugging; Software prototyping; Timing;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
Print_ISBN :
0-7803-8582-9
DOI :
10.1109/IEMT.2004.1321676