• DocumentCode
    3289544
  • Title

    Time-varying, frequency-domain modeling and analysis of phase-locked loops with sampling phase-frequency detectors

  • Author

    Vanassche, Piet ; Gielen, Georges ; Sansen, Willy

  • Author_Institution
    ESAT/MICAS, Katholieke Univ., Leuven, Belgium
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    238
  • Lastpage
    243
  • Abstract
    This paper presents a new, frequency-domain based method for modeling and analysis of phase-locked loop (PLL) small-signal behavior, including time-varying aspects. Focus is given to PLLs with sampling phase-frequency detectors (PFDs) which compute the phase error only once per period of the reference signal. Using the harmonic transfer matrix (HTM) formalism, the well known continuous-time, linear time-invariant (LTI) approximations are extended to take the impact of time-varying behavior arising from the sampling nature of the PFD, into account. Especially for PLLs with a fast feedback loop, this time-varying behavior has severe impact on, for example, loop stability and cannot be neglected. Contrary to LTI analysis, our method is able to predict and quantify these difficulties. The method is verified for a typical loop design.
  • Keywords
    circuit feedback; circuit stability; frequency-domain analysis; harmonic analysis; invariance; network analysis; phase detectors; phase locked loops; time-varying networks; HTM formalism; LTI approximations; PFD phase error computation; PLL small-signal behavior; continuous-time linear time-invariant approximations; fast feedback loop; frequency-domain analysis; harmonic transfer matrix; loop stability; phase-locked loop analysis; sampling phase-frequency detectors; time-varying frequency-domain modeling; Feedback loop; Frequency domain analysis; Frequency synthesizers; Phase detection; Phase frequency detector; Phase locked loops; Power harmonic filters; Sampling methods; Stability; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1186392
  • Filename
    1186392