• DocumentCode
    3289549
  • Title

    Development of high power QFN package

  • Author

    KS, Francis Poh ; Boon, Tan Hien ; Sivalingam, Krishnamoorthi ; Kuan, Lim Beng ; Sun, Anthony Y S ; Bidin, Rahamat

  • Author_Institution
    United Test & Assembly Center, Singapore, Singapore
  • fYear
    2004
  • fDate
    July 14-16, 2004
  • Firstpage
    295
  • Lastpage
    300
  • Abstract
    Leadframe CSP package had been well known to be a superior choice for high-speed application where high thermal performance is desired. With the advancement in technology trend, there is more increasing demand for higher thermal performance in miniature package to dissipate heat and improve the device performances. This paper describes the cost-effective development and material characterisation of high power quad flat no lead (HQFN) package that had successfully been qualified in United Test and Assembly Center (UTAC) at JEDEC level 2A with full environmental testing. The assembly processes are leveraged from the standard QFN assembly with only the inclusion of silicon lid attached over the integrated chip, hence, creating an addition heat dissipation path to the top surface. The package thermal performance is dependent on the surface area of the exposed lid, which is governed by the die size or bond pad layout. Package larger than HQFN 7×7 size can achieve higher thermal performance than the exposed top paddle´s smart metal chip scale package (SMCSP). Existing leadframe can be used for this HQFN package and its outline conformed to the JEDEC registered outline MO221 for QFN packages.
  • Keywords
    chip scale packaging; cooling; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; HQFN package; Si; United Test and Assembly Center; bond pad layout; cost-effective package development; device performance improvement; die size; heat dissipation; high power QFN package; high thermal performance; integrated chip; leadframe CSP package; lid surface area; material characterisation; miniature packages; package thermal performance; quad flat no lead package; silicon lid; smart metal chip scale package; standard QFN assembly; Assembly; Bonding; Chip scale packaging; Costs; Electronic packaging thermal management; Integrated circuit packaging; Lead; Materials testing; Silicon; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-8582-9
  • Type

    conf

  • DOI
    10.1109/IEMT.2004.1321678
  • Filename
    1321678