Title :
Producing phototransistors in a standard digital CMOS technology
Author :
Sandage, Robert W. ; Connelly, J.Alvin
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Development of a standard CMOS fingerprint identification system has necessitated the search for a photodetector with the optimum performance of responsivity, crosstalk, dynamic range, and matching parameters. Pixel resolution is also important in order that fingerprint features on the order of 80 μm may be detected. This paper discusses six phototransistor configurations easily produced in CMOS technology and compares their experimental performance
Keywords :
CMOS digital integrated circuits; crosstalk; fingerprint identification; integrated circuit technology; photodetectors; phototransistors; 80 micron; crosstalk; digital CMOS technology; dynamic range; fingerprint identification; matching parameters; photodetector; phototransistor; pixel resolution; responsivity; CMOS process; CMOS technology; Crosstalk; Dynamic range; Fingerprint recognition; Photoconductivity; Photodetectors; Photodiodes; Phototransistors; Standards development;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.539906
