DocumentCode
3289644
Title
On Testing Delay Faults In Macro-based Combinational Circuits
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
fYear
1994
fDate
6-10 Nov 1994
Firstpage
332
Lastpage
339
Keywords
Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Delay effects; Hardware; Integrated circuit interconnections; Logic circuits; Propagation delay; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN
1063-6757
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1994.629813
Filename
629813
Link To Document