DocumentCode :
3289769
Title :
Sustainment of legacy automatic test systems: lessons learned on TPS transportability
Author :
Kennedy, Cathleen
Author_Institution :
Syst. & Electron. Inc., St. Louis, MO, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
217
Lastpage :
222
Abstract :
Sustainment of legacy automatic test systems (ATS) saves cost through the reuse of software and hardware. The ATS consists of the automatic test equipment (ATE), the test program sets (TPSs) and associated software. The associated software includes the architecture the TPSs run on, known as the control software or test station test executive. In some cases, to sustain the legacy ATS, it is more practical to develop a replacement ATE with the latest instrumentation, often in the form of commercial off the shelf (COTS) hardware and software. The existing TPSs, including their hardware and test programs, will then need to be transported, or translated, to the new test station. In order to understand how to sustain a legacy ATS by translating TPSs, one must realize the full architecture of the legacy ATS to be replaced. It must be understood that TPS transportability does not only include translating the original TPS from an existing language (such as ATLAS) to a new language (such as ´C´) to run on a new test station, but includes transporting the run-time environment created by the legacy ATS. This paper examines the similarities and differences of legacy ATE and modern COTS ATE architectures, how the ATS testing philosophy impacts the ease of TPS transportability from legacy ATE to modern day platforms and what SEI has done to address the issues that arise out of TPS transportability.
Keywords :
automatic test equipment; automatic test software; software architecture; software maintenance; software packages; ATLAS; COTS ATE architectures; TPS transportability; automatic test equipment; legacy automatic test system sustainment; test program sets; Automatic control; Automatic test equipment; Automatic testing; Computer architecture; Costs; Hardware; Instruments; Runtime; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436835
Filename :
1436835
Link To Document :
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