Title :
Raft: A Novel Program For Rapid-fire Test And Diagnosis Of Digital Logic For Marginal Delays And Delay Faults
Author :
Chatterjee, Abhijit ; Abraham, Jacob A.
Keywords :
Circuit faults; Circuit testing; Clocks; Combinational circuits; Digital circuits; Fault diagnosis; Logic testing; Propagation delay; Signal analysis; Timing;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629814
