Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material

Author

Hock, Goh Chin ; Chakrabarty, Chandan Kumar ; Badjian, Mohammad Hadi ; Devkumar, Sanjay ; Emilliano

Author_Institution

Dept. of Electron. & Commun. Eng., Univ. Tenaga Nasional, Kajang

fYear

2008

fDate

2-4 Dec. 2008

Firstpage

167

Lastpage

170

Abstract

This paper describes the use of AD8302 evaluation board from Analog Devices in super-heterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabViewtrade graphical programming language.

Keywords

data communication; dielectric measurement; heterodyne detection; light interferometers; millimetre wave measurement; visual languages; data processing; graphical programming language; millimeter wave interferometer; non contact dielectric measurements; super heterodyne interferometer; Computer languages; Data processing; Dielectric materials; Dielectric measurements; Millimeter wave devices; Millimeter wave measurements; Performance evaluation; Phase shifting interferometry; Signal analysis; Voltage; Dielectric Constant and Millimeter Wave; Interferometer; Phase Sensitive Detector; Superheterodyne;

fLanguage

English

Publisher

ieee

Conference_Titel

RF and Microwave Conference, 2008. RFM 2008. IEEE International

Conference_Location

Kuala Lumpur

Print_ISBN

978-1-4244-2866-3

Electronic_ISBN

978-1-4244-2867-0

Type

conf

DOI

10.1109/RFM.2008.4897416

Filename

4897416