DocumentCode
3290076
Title
Channel profile optimization and device design for low-power high-performance dynamic-threshold MOSFET
Author
Wann, C. ; Assaderaghi, F. ; Dennard, R. ; Chenming Hu ; Shahidi, G. ; Taur, Y.
Author_Institution
IBM Thomas J. Watson Res. Center, Yortown Heights, NY, USA
fYear
1996
fDate
8-11 Dec. 1996
Firstpage
113
Lastpage
116
Abstract
In this work device design of DTMOS and its parasitic components are studied by experiments and simulations. The gate and the body are tied at the side of the device. Similar gate-body tie can also be accomplished in bulk substrate using multiple-well technology. For a circuit whose speed is predominately determined by wiring capacitances, DTMOS can greatly enhance performance by engineering the vertical doping profiles to scale the depletion width. When the circuit speed is dominated by device capacitances, lateral doping engineering is important to reduce Cbs and Cbd in order to obtain performance improvements, especially in certain logic circuits where Miller effect is important.
Keywords
MOSFET; capacitance; doping profiles; semiconductor doping; semiconductor quantum wells; wiring; DTMOS; Miller effect; channel profile optimization; circuit speed; device capacitances; device design; dynamic-threshold MOSFET; gate-body tie; multiple-well technology; parasitic components; vertical doping profiles; wiring capacitances; Circuit simulation; Design optimization; Doping; MOSFET circuits; Parasitic capacitance; Power supplies; Switches; Switching circuits; Threshold voltage; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Print_ISBN
0-7803-3393-4
Type
conf
DOI
10.1109/IEDM.1996.553134
Filename
553134
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