• DocumentCode
    3290076
  • Title

    Channel profile optimization and device design for low-power high-performance dynamic-threshold MOSFET

  • Author

    Wann, C. ; Assaderaghi, F. ; Dennard, R. ; Chenming Hu ; Shahidi, G. ; Taur, Y.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yortown Heights, NY, USA
  • fYear
    1996
  • fDate
    8-11 Dec. 1996
  • Firstpage
    113
  • Lastpage
    116
  • Abstract
    In this work device design of DTMOS and its parasitic components are studied by experiments and simulations. The gate and the body are tied at the side of the device. Similar gate-body tie can also be accomplished in bulk substrate using multiple-well technology. For a circuit whose speed is predominately determined by wiring capacitances, DTMOS can greatly enhance performance by engineering the vertical doping profiles to scale the depletion width. When the circuit speed is dominated by device capacitances, lateral doping engineering is important to reduce Cbs and Cbd in order to obtain performance improvements, especially in certain logic circuits where Miller effect is important.
  • Keywords
    MOSFET; capacitance; doping profiles; semiconductor doping; semiconductor quantum wells; wiring; DTMOS; Miller effect; channel profile optimization; circuit speed; device capacitances; device design; dynamic-threshold MOSFET; gate-body tie; multiple-well technology; parasitic components; vertical doping profiles; wiring capacitances; Circuit simulation; Design optimization; Doping; MOSFET circuits; Parasitic capacitance; Power supplies; Switches; Switching circuits; Threshold voltage; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1996. IEDM '96., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-3393-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1996.553134
  • Filename
    553134