Title :
The development of statistical parameter measuring analyser using the APD technique for DSL communication
Author :
Abidin, A. N Zainal ; Abdullah, W. R Wan ; Jenu, M.Z.M. ; Ramli, A.
Author_Institution :
EMC & Power Quality Program, TM Res. & Dev. Sdn. Bhd.
Abstract :
The amplitude probability distribution (APD) has been proposed within comite international special des perturbations radioelectriques (CISPR) as a measure of the emitted electromagnetic interference from electrical appliances or equipment. The APD approach is effective for estimating the noise impact towards degradation of digital communication performance. This paper presents the development of APD analyzer for simultaneous measurement of noise emission on digital subscriber line (DSL) communication. Noise statistics have been measured by using the analyser. It is vital to have correct measurement set-up, signal power level, sampling rate, sample points and filter characterization in order to acquire accurate data representation of the noise pattern. The APD graph was obtained from computer calculation that using the APD algorithm method which employing existing time ratio. The noises are characterized using alpha-distribution functions that exhibiting its own distinct APD parameters alpha, beta and gamma which will be verified in single modulation scheme for estimation of bit error probability. The analyser will record and analyse results of noise pattern emission from various sources of interference. The analyser provides the platform for interference verification of man-made noise emission towards DSL communication performance.
Keywords :
digital subscriber lines; error statistics; interference suppression; noise measurement; alpha-distribution functions; amplitude probability distribution technique; bit error probability; comite international special des perturbations radioelectriques; digital communication performance; digital subscriber line communication; electromagnetic interference; filter characterization; noise pattern emission; noise statistics; sample points; sampling rate; signal power level; statistical parameter measuring analyser; DSL; Degradation; Digital communication; Electric variables measurement; Electrical products; Electromagnetic interference; Electromagnetic measurements; Noise measurement; Pattern analysis; Probability distribution; α-Distribution; APD; BER; DSL; Impulsive Noise;
Conference_Titel :
RF and Microwave Conference, 2008. RFM 2008. IEEE International
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-2866-3
Electronic_ISBN :
978-1-4244-2867-0
DOI :
10.1109/RFM.2008.4897423