• DocumentCode
    329013
  • Title

    Electrical Characterization of a Mapham Inverter Using Pulse Testing Techniques

  • Author

    Baumann, E.D. ; Myers, I.T. ; Hammoud, A.N.

  • Author_Institution
    Sverdrup Technology, Inc., NASA Lewis Research Center, Cleveland, Ohio
  • Volume
    1
  • fYear
    1990
  • fDate
    12-17 Aug 1990
  • Firstpage
    423
  • Lastpage
    427
  • Keywords
    Aerospace testing; Costs; NASA; Power electronics; Power system reliability; Power system simulation; Power systems; Pulse inverters; Pulse power systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 1990. IECEC-90. Proceedings of the 25th Intersociety
  • Print_ISBN
    0-8169-0490-1
  • Type

    conf

  • DOI
    10.1109/IECEC.1990.716931
  • Filename
    716931
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=329013