DocumentCode :
3290179
Title :
Singular value decomposition for texture defect detection in visual inspection systems
Author :
Tomczak, L. ; Mosorov, V.
Author_Institution :
Dept. of Comput. Eng., Lodz Tech. Univ., Stefanowskiego
fYear :
2006
fDate :
38838
Firstpage :
131
Lastpage :
133
Abstract :
In this paper the authors propose an algorithm for texture defects detection, which doesn´t use supervised classification. The algorithm can be simply applied in an automatic visual inspection system. For localization of texture defects features calculation of each non-overlapping region of an image via the singular value decomposition (SVD) and image processing techniques. In next step the algorithm uses the fuzzy c-means clustering (FCM) to classify each region into two clusters. Finally the authors define a distance between centres of defective and non-defective clusters using some threshold value chosen empirically
Keywords :
automatic optical inspection; fuzzy systems; image processing; image texture; singular value decomposition; automatic visual inspection system; defective clusters; fuzzy c-means clustering; image processing techniques; nondefective clusters; nonoverlapping region; singular value decomposition; texture defect detection; Classification algorithms; Clustering algorithms; Digital images; Fabrics; Image processing; Inspection; Matrix decomposition; Singular value decomposition; Surface texture; Surface waves; automatic visual inspection system; singular value decomposition; texture defects detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Perspective Technologies and Methods in MEMS Design, 2006. MEMSTECH 2006. Proceedings of the 2nd International Conference on
Conference_Location :
Lviv
Print_ISBN :
966-553-517-X
Type :
conf
DOI :
10.1109/MEMSTECH.2006.288681
Filename :
4068445
Link To Document :
بازگشت