DocumentCode :
3290252
Title :
CMOS Technology For 1.8V And Beyond
Author :
Sun, Jack Y -C
fYear :
1997
fDate :
3-5 June 1997
Firstpage :
293
Lastpage :
297
Keywords :
CMOS technology; Delay; Dielectrics; Doping; Hot carrier effects; Implants; Inverters; Lifting equipment; Research and development; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
ISSN :
1524-766X
Print_ISBN :
0-7803-4131-7
Type :
conf
DOI :
10.1109/VTSA.1997.614912
Filename :
614912
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3290252