DocumentCode :
3290311
Title :
Scheduling and timing analysis of HW/SW on-chip communication in MP SoC design
Author :
Cho, Youngchul ; Lee, Ganghee ; Yoo, Sungjoo ; Choi, Kiyoung ; Zergainoh, Nacer-Eddine
Author_Institution :
Design Autom. Lab., Seoul Nat. Univ., South Korea
fYear :
2003
fDate :
2003
Firstpage :
132
Abstract :
On-chip communication design includes designing software (SW) parts (operating system, device drivers, interrupt service routines, etc.) as well as hardware (HW) parts (on-chip communication network, communication interfaces of processor/IP/memory, on-chip memory, etc.). For an efficient exploration of its design space, we need fast scheduling and timing analysis. In this work, we tackle two problems (one for SW and the other for HW) in on-chip communication design. One is to incorporate the dynamic behavior of SW (interrupt processing and context switching) into on-chip communication scheduling. The other is to reduce on-chip data storage required for on-chip communication, by sharing physical communication buffers with different communication transactions. To solve the problems, we present both ILP (integer linear programming) formulation and heuristic algorithm, which enable the designer to perform efficient onchip communication scheduling and obtain accurate timing information. Experimental results show the effectiveness of our work.
Keywords :
circuit CAD; hardware-software codesign; integer programming; integrated circuit design; linear programming; multiprocessing systems; processor scheduling; system-on-chip; timing; HW/SW on-chip communication; ILP formulation; communication buffers; context switching; heuristic algorithm; integer linear programming; interrupt processing; multiprocessor SoC design; multiprocessor system on chip; on-chip communication scheduling; on-chip data storage; timing analysis; Communication networks; Communication system software; Context; Hardware; Network-on-a-chip; Operating systems; Processor scheduling; Software design; System-on-a-chip; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1186684
Filename :
1186684
Link To Document :
بازگشت