Physicochemical, electrical and stability properties of carbon black/polyesterimide thick-film resistors

Author

Dziedzic, Andrzej

Author_Institution

Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland, Phone/Fax: +48 - 71 - 355 48 22, andrzej.dziedzic@pwr.wroc.pl

fYear

2005

fDate

23-26 Oct. 2005

Firstpage

16

Lastpage

24

Abstract

This paper describes carbon/polyesterimide thick-film resistive composites. Polyesterimide (PEI) resin with high thermal durability served as an insulative matrix whereas medium structure carbon black (MSCB), blend of MSCB and graphite (G), and high structure carbon black (HSCB) have been used as an active phase. Chosen physicochemical investigations, standard electrical measurements (dependence of basic electrical properties on kind and content of conductive filler, curing method and curing temperature) as well as nonstandard electrical methods (1/f noise and voltage nonlinearity properties) and various stability tests have been used for complete description of MSCB/PEI, (MSCB+G)/PEI and HSCB/PEI thick-film resistor series.

Keywords

1/f noise; Polymer thick film; fabrication; long-term stability; percolation; pulse durability; resistor; sheet resistance; third harmonic; Conductivity measurement; Curing; Electric variables measurement; Insulation; Measurement standards; Noise measurement; Resins; Resistors; Stability; Thickness measurement; 1/f noise; Polymer thick film; fabrication; long-term stability; percolation; pulse durability; resistor; sheet resistance; third harmonic;

fLanguage

English

Publisher

ieee

Conference_Titel

Polymers and Adhesives in Microelectronics and Photonics, Polytronic, 2005. Polytronic 2005. 5th International Conference on

Print_ISBN

0-7803-9553-0

Type

conf

DOI

10.1109/POLYTR.2005.1596480

Filename

1596480