DocumentCode
329048
Title
Analysis of statistical training method
Author
Liang, Xun ; XIA, Shaowei
Author_Institution
Dept. of Autom., Tsinghua Univ., Beijing, China
Volume
2
fYear
1993
fDate
25-29 Oct. 1993
Firstpage
1657
Abstract
This paper analyzes the statistical method of training multilayer perceptrons (MLPs) with binary patterns. First, several MLPs are trained until they are trapped in local minima; then they are fabricated into the demanding one. The average number of the MLPs which may be used in primary training is estimated. Two examples are given and techniques in fabricating are discussed.
Keywords
learning (artificial intelligence); multilayer perceptrons; probability; statistical analysis; binary patterns; local minima; multilayer perceptrons; probability; statistical training; Automation; Laboratories; Management information systems; Multilayer perceptrons; Neurons; Pattern analysis; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
Print_ISBN
0-7803-1421-2
Type
conf
DOI
10.1109/IJCNN.1993.716970
Filename
716970
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