• DocumentCode
    3290526
  • Title

    A fully qualified top-down and bottom-up mixed-signal design flow for non volatile memories technologies

  • Author

    Daglio, Pierluigi ; Roma, Carlo

  • Author_Institution
    STMicroelectronics N.V., Milan, Italy
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    274
  • Abstract
    The wide range and rapid increase in the complexity of EDA tools demand proven and safe design flows. This paper presents a complete and fully qualified mixed-signal top-down design flow for non volatile memory applications. It has been successfully applied to an embedded flash macrocell based design as well as to a 14 bit analog/digital converter with digital non linearity compensation manufactured in 0.18 μm proprietary flash technology. One remarkable feature of the proposed methodology is the high level of integration among EDA tools from different vendors and internally developed solutions. The mixed-signal domain has been really explored at all levels: functional, behavioural, VHDL/schematic and post layout with parasitic components. Furthermore, we propose a bottom-up methodology to generate and validate VHDL-AMS models for IP analog cells. All the illustrated features are integrated in a design flow which provides full compatibility and flexibility between analog and digital design steps to cut down time-to-design, improve time-to-market and streamline design quality.
  • Keywords
    analogue-digital conversion; circuit CAD; circuit simulation; flash memories; integrated circuit design; integrated circuit modelling; random-access storage; 0.18 micron; EDA tools integration; IP analog cells; VHDL-AMS models; analog/digital converter; bottom-up design; digital nonlinearity compensation; embedded flash macrocell; nonvolatile memories technologies; top-down mixed-signal design flow; Automata; Circuit simulation; Circuit testing; Europe; Flowcharts; Macrocell networks; Nonvolatile memory; Software libraries; Switches; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1186708
  • Filename
    1186708