• DocumentCode
    3290748
  • Title

    Organic thin film transistors with HfO2high-k gate dielectric grown by anodic oxidation or deposited by sol-gel

  • Author

    Tardy, J. ; Erouel, M. ; Deman, A.L. ; Gagnaire, A. ; Jaffrezic, N. ; Teodorescu, V. ; Blanchin, G. ; Canut, B. ; Barau, A. ; Zaharescu, M.

  • Author_Institution
    Ecole Centrale de Lyon, LEOM, 69134 Ecully, FRANCE, jacques.tardy@ec-lyon.fr
  • fYear
    2005
  • fDate
    23-26 Oct. 2005
  • Firstpage
    113
  • Lastpage
    116
  • Abstract
    We report here on pentacene based organic field effect transistors (OFETs) with a high-k HfO2gate oxide. HfO2layers were prepared by two different methods: anodic oxidation and sol-gel. A comparison of the two processes on the electrical properties of OFETs is given. Ultra thin nanoporous (20 nm) sol-gel deposited oxide films were obtained following an annealing at 450°C. They lead to high mobility and stable devices (μ=0.12 cm2/V.s). On the other hand, devices with anodic HfO2revealed a little bit more leaky and show some hysteresis. Anodization, however, presents the advantage of being a fully room temperature process, compatible with plastic substrates.
  • Keywords
    HfO; Organic transistors; high-k oxides; pentacene; Annealing; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Hysteresis; Nanoporous materials; OFETs; Organic thin film transistors; Oxidation; Pentacene; HfO; Organic transistors; high-k oxides; pentacene;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Polymers and Adhesives in Microelectronics and Photonics, Polytronic, 2005. Polytronic 2005. 5th International Conference on
  • Print_ISBN
    0-7803-9553-0
  • Type

    conf

  • DOI
    10.1109/POLYTR.2005.1596498
  • Filename
    1596498