Title :
Organic thin film transistors with HfO2high-k gate dielectric grown by anodic oxidation or deposited by sol-gel
Author :
Tardy, J. ; Erouel, M. ; Deman, A.L. ; Gagnaire, A. ; Jaffrezic, N. ; Teodorescu, V. ; Blanchin, G. ; Canut, B. ; Barau, A. ; Zaharescu, M.
Author_Institution :
Ecole Centrale de Lyon, LEOM, 69134 Ecully, FRANCE, jacques.tardy@ec-lyon.fr
Abstract :
We report here on pentacene based organic field effect transistors (OFETs) with a high-k HfO2gate oxide. HfO2layers were prepared by two different methods: anodic oxidation and sol-gel. A comparison of the two processes on the electrical properties of OFETs is given. Ultra thin nanoporous (20 nm) sol-gel deposited oxide films were obtained following an annealing at 450°C. They lead to high mobility and stable devices (μ=0.12 cm2/V.s). On the other hand, devices with anodic HfO2revealed a little bit more leaky and show some hysteresis. Anodization, however, presents the advantage of being a fully room temperature process, compatible with plastic substrates.
Keywords :
HfO; Organic transistors; high-k oxides; pentacene; Annealing; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Hysteresis; Nanoporous materials; OFETs; Organic thin film transistors; Oxidation; Pentacene; HfO; Organic transistors; high-k oxides; pentacene;
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, Polytronic, 2005. Polytronic 2005. 5th International Conference on
Print_ISBN :
0-7803-9553-0
DOI :
10.1109/POLYTR.2005.1596498