• DocumentCode
    3290755
  • Title

    Optimization Of Tilt-implanted Punchthrough Stopper On Short-channel Behavior In Quarter-micron Mosfet With Low-concentration Wells

  • Author

    Lin, Chih-Hsien ; Yang, Jiunn-Jer ; Young, Konrad ; Chiu, Kuang-Yi

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    303
  • Lastpage
    306
  • Keywords
    Degradation; Doping; Electronics industry; Implants; Industrial electronics; Leakage current; MOS devices; MOSFET circuits; Optimization methods; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614915
  • Filename
    614915