• DocumentCode
    3290915
  • Title

    Dynamic multiple fault diagnosis with imperfect tests

  • Author

    Ruan, Sui ; Yu, Feili ; Meirina, Candra ; Pattipati, Krishna R. ; Patterson-Hine, Ann

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    395
  • Lastpage
    401
  • Abstract
    Fault diagnosis is the process of identifying the failure sources of a malfunctioning system by observing their effects at various test points. It has a number of applications in engineering and medicine. In this paper, we present a near-optimal algorithm for dynamic multiple fault diagnosis in complex systems. This problem involves on-board diagnosis of the most likely set of faults and their time-evolution based on blocks of unreliable test outcomes over time. The dynamic multiple fault diagnosis (dMFD) problem is an intractable NP-hard combinatorial optimization problem. Consequently, we decompose the dMFD problem into a series of decoupled sub-problems, and develop a successive Lagrangian relaxation algorithm (SLRA) with backtracking to obtain a near-optimal solution for the problem. SLRA solves the sub-problems at each sample point by a Lagrangian relaxation method, and shares Lagrange multipliers at successive time points to speed up convergence. In addition, we apply a backtracking technique to further maximize the likelihood of obtaining the most likely evolution of failure sources and to minimize the effects of imperfect tests.
  • Keywords
    backtracking; convergence; fault diagnosis; large-scale systems; maximum likelihood estimation; optimisation; relaxation theory; NP-hard combinatorial optimization problem; backtracking; complex system; convergence; dynamic multiple fault diagnosis; fault diagnosis; maximize likelihood; near-optimal algorithm; on-board diagnosis; successive Lagrangian relaxation algorithm; Fault diagnosis; Hidden Markov models; Lagrangian functions; Logic testing; Medical diagnostic imaging; Sampling methods; Satellite ground stations; Sensor systems; System testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2004. Proceedings
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-8449-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.2004.1436895
  • Filename
    1436895