DocumentCode :
3290915
Title :
Dynamic multiple fault diagnosis with imperfect tests
Author :
Ruan, Sui ; Yu, Feili ; Meirina, Candra ; Pattipati, Krishna R. ; Patterson-Hine, Ann
Author_Institution :
Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
395
Lastpage :
401
Abstract :
Fault diagnosis is the process of identifying the failure sources of a malfunctioning system by observing their effects at various test points. It has a number of applications in engineering and medicine. In this paper, we present a near-optimal algorithm for dynamic multiple fault diagnosis in complex systems. This problem involves on-board diagnosis of the most likely set of faults and their time-evolution based on blocks of unreliable test outcomes over time. The dynamic multiple fault diagnosis (dMFD) problem is an intractable NP-hard combinatorial optimization problem. Consequently, we decompose the dMFD problem into a series of decoupled sub-problems, and develop a successive Lagrangian relaxation algorithm (SLRA) with backtracking to obtain a near-optimal solution for the problem. SLRA solves the sub-problems at each sample point by a Lagrangian relaxation method, and shares Lagrange multipliers at successive time points to speed up convergence. In addition, we apply a backtracking technique to further maximize the likelihood of obtaining the most likely evolution of failure sources and to minimize the effects of imperfect tests.
Keywords :
backtracking; convergence; fault diagnosis; large-scale systems; maximum likelihood estimation; optimisation; relaxation theory; NP-hard combinatorial optimization problem; backtracking; complex system; convergence; dynamic multiple fault diagnosis; fault diagnosis; maximize likelihood; near-optimal algorithm; on-board diagnosis; successive Lagrangian relaxation algorithm; Fault diagnosis; Hidden Markov models; Lagrangian functions; Logic testing; Medical diagnostic imaging; Sampling methods; Satellite ground stations; Sensor systems; System testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436895
Filename :
1436895
Link To Document :
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