Title :
A 10-bit 100MSPS 0.35 μm Si CMOS pipeline ADC
Author :
Yu, Qi ; Wang, Xiang-zhan ; Ning, Ning ; Tang, Lin ; Li, Hong-Bin ; Yang, Mo-hua
Author_Institution :
Coll. of Microelectron. & Solid-State Electron., China Electron. Sci. & Technol. Univ., Chengdu, China
Abstract :
Based on the principle of pipeline ADC, a 4-4-4-bit three-stage 10-bit pipeline analog-to-digital converter (ADC) is presented. Combining with bootstrap circuit and bottom-plate sampling technology, a high linearity on-chip sample-and-hold (S/H) is realized. The preamplifier-latch comparator of the 4-bit flash sub-ADCs is implemented to reduce the comparator latch offset by using zero-crossing technique. In order to reduce common-mode interference, clock feed-through and even order distortion, the full-differential operational transconductance amplifiers (OTA) are designed for the residue and S/H circuits. The simulation results show that this ADC achieves over 70dB SFDR with 50MHz Nyquist input frequency at 100MSample/s (MSPS). Fabricated by standard 0.35μm 2P3M mixed signal silicon CMOS process, the circuit occupies an area of 12.7mm2.
Keywords :
CMOS integrated circuits; analogue-digital conversion; bootstrap circuits; comparators (circuits); elemental semiconductors; mixed analogue-digital integrated circuits; operational amplifiers; sample and hold circuits; silicon; 0.35 micron; 10 bit; 50 MHz; CMOS pipeline ADC; Nyquist input frequency; Si; analogue-digital converter; bootstrap circuit; bottom-plate sampling; circuit simulation; clock feed-through; common-mode interference; comparator latch offset; even order distortion; flash sub-ADC; mixed signal silicon CMOS process; on-chip sample-and-hold circuit; operational transconductance amplifier; preamplifier-latch comparator; three-stage ADC; zero-crossing technique; Analog-digital conversion; CMOS technology; Circuits; Clocks; Interference; Latches; Linearity; Pipelines; Sampling methods; Transconductance;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1436902