DocumentCode :
3291125
Title :
Reduction of baseband electrical memory effects using broadband active baseband load-pull
Author :
Chaudhary, Muhammad Akmal ; Lees, J. ; Benedikt, J. ; Tasker, P.
Author_Institution :
Dept. of Electr. Eng., Ajman Univ. of Sci. & Technol., Ajman, United Arab Emirates
fYear :
2013
fDate :
14-18 April 2013
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents an enhanced active baseband load-pull capability that allows constant, frequency independent baseband load environments to be presented across wide modulation bandwidths. This capability is critical in allowing the effects of baseband impedance variation has on the performance of nonlinear microwave devices, when are driven by broadband multi-tone stimuli, to be fully investigated. The experimental investigations were carried out using a 10W GaN HEMT device, under 9-carrier complex multi-tone excitation.
Keywords :
HEMT circuits; III-V semiconductors; gallium compounds; power amplifiers; wide band gap semiconductors; 9-carrier complex multitone excitation; GaN; HEMT device; active baseband load-pull capability; baseband electrical memory effects; baseband impedance variation; broadband active baseband load-pull; broadband multitone stimuli; frequency independent baseband load environments; nonlinear microwave devices; power 10 W; wide modulation bandwidths; Baseband; Broadband communication; Frequency measurement; Frequency modulation; Impedance; Microwave amplifiers; Active IF load-pull; baseband; broadband; memory effects; modulation; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Symposium (IWS), 2013 IEEE International
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/IEEE-IWS.2013.6616709
Filename :
6616709
Link To Document :
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