• DocumentCode
    3291288
  • Title

    The down converter - a critical synthetic instrument technology

  • Author

    Mahal, Charanbir ; Granieri, Michael N.

  • Author_Institution
    VP Eng., Phase Matrix, Inc., San Jose, CA, USA
  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    422
  • Lastpage
    427
  • Abstract
    This paper provides a brief overview of RF/microwave frequency translation functionality (up converters & down converters) and technology and discusses why they are important in the context of DOD related test and measurement. The paper then briefly reviews the concept of synthetic instruments (SI) and the role of the down converter in the SI paradigm. The paper then introduces the reader to some critical down converter specifications that must be optimized over a broad array of user RF/microwave test requirements. Based on this dissertation, the authors set forth their "One size does not fit all" thesis and introduce the concept of a "family of down converters". The authors then describe a flexible/modular down converter architecture that can be tailored to address a broad cross-section of down converter user needs. The paper then concludes with a summary statement by the authors about this critical synthetic instrument technology.
  • Keywords
    automatic test equipment; convertors; microwave frequency convertors; RF/microwave frequency translation functionality; RF/microwave test requirement; down converter specification; flexible/modular down converter architecture; synthetic instrument technology; up converter; Frequency measurement; Instruments; Microwave antenna arrays; Microwave frequencies; Microwave measurements; Microwave technology; Paper technology; Radio frequency; Testing; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2004. Proceedings
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-8449-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.2004.1436916
  • Filename
    1436916