Title :
Apply tapping mode Atomic Force Microscope with CD/DVD pickup head in fluid
Author :
Shih-Hsun Yen ; Jim-Wei Wu ; Li-Chen Fu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
June 30 2010-July 2 2010
Abstract :
This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate the interaction force between the tip and the sample. To implement the above systems, we have designed a novel AFM mechanism and proposed an adaptive sliding-mode controller for it. For testing the system capability and analyzing the biomorphic change of the sample in liquid, we have conducted a series of experiments, and the results can help us to understand more about the mechanism of the sample in liquid.
Keywords :
Q-factor; adaptive control; atomic force microscopy; cantilevers; digital versatile discs; CD/DVD pickup head; Q-controller; adaptive quality-factor-controller; biomorphic change; cantilever beam; tapping mode atomic force microscope; Adaptive control; Atomic beams; Atomic force microscopy; Atomic measurements; DVD; Force measurement; Probes; Programmable control; Sliding mode control; Structural beams;
Conference_Titel :
American Control Conference (ACC), 2010
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-7426-4
DOI :
10.1109/ACC.2010.5531415