DocumentCode
3291441
Title
Real world applications of synthetic instrumentation
Author
Brown, Scott
Author_Institution
Syst. & Electron. Inc., Louis, MO, USA
fYear
2004
fDate
20-23 Sept. 2004
Firstpage
434
Lastpage
439
Abstract
A current focus of many instrumentation and automatic test equipment (ATE) designers is the area of synthetic instrumentation. This instrumentation, which consists of physically separate building blocks or modules, provides the opportunity to reduce the system´s overall hardware content by eliminating common hardware functionality located within each traditional instrument. This modular design provides opportunities for lower lifecycle cost, smaller physical packages and increased capabilities through module upgrades. However, the design of synthetic instrumentation and its integration into an ATE system poses technical challenges not typically seen with traditional instrumentation. Traditional instrument developers are now faced with the challenge of determining how their existing and future modules, for example a digitizer or waveform generator, satisfy a portion of the requirements of a synthetic instrument. ATE developers are challenged to identify the proper set of modules, primarily commercial off the shelf (COTS), that together satisfy the system level requirements. In addition, they must address instrumentation concurrency, synchronization, switching, and develop a software and hardware architecture that supports future upgrades as technology advances. Each of these issues requires a strong system engineering discipline that can develop a robust system architecture.
Keywords
automatic test equipment; real-time systems; software packages; systems engineering; COTS; automatic test equipment; commercial off the shelf; instrumentation concurrency; real world application; software-hardware architecture; switching; synchronization; synthetic instrumentation; system engineering; system level requirement; waveform generator; Automatic test equipment; Computer architecture; Concurrent computing; Costs; Hardware; Instruments; Packaging; Robustness; Signal generators; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON 2004. Proceedings
ISSN
1088-7725
Print_ISBN
0-7803-8449-0
Type
conf
DOI
10.1109/AUTEST.2004.1436921
Filename
1436921
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