Title :
Wavelet singularity detection for image processing
Author :
Lun, Daniel Pak-Kong ; Hsung, Tai-Chiu ; Ho, Yuk-Fan
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China
Abstract :
The idea of wavelet singularity detection (WSD) can be traced back to the work of Jaffard. He showed that the local regularity of an n-dimensional signal (which is measured through its Lipschitz exponent) can be estimated by analyzing its n+1-dimensional scale-space. Mallat further showed that the Lipschitz exponent of a singularity can be estimated by tracing its wavelet transform modulus maxima (WTMM). Nevertheless, the tracing of WTMM is not just a tedious procedure computationally; ambiguity often results from determining the correspondence of a modulus maximum to a singularity. In that light, the wavelet transform modulus sum (WTMS) approach was proposed. In this paper, the applications of WTMS in image denoising, compressed image deblocking, and scalable image coding are described. They show that WSD is a valuable tool for image processing and has widespread applications.
Keywords :
data compression; image coding; image denoising; wavelet transforms; Lipschitz exponent; WSD applications; WTMM tracing; WTMS; compressed image deblocking; image denoising; image processing; n+1-dimensional scale-space; n-dimensional signal local regularity; scalable image coding; singularity; wavelet singularity detection; wavelet transform modulus maxima; wavelet transform modulus sum approach; Image coding; Image denoising; Image processing; Noise reduction; Polynomials; Signal analysis; Signal processing; Upper bound; Wavelet coefficients; Wavelet transforms;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1186821