DocumentCode :
3291874
Title :
Hot Carrier Reliability Considerations For High Performance Submicron Mosfet´s
Author :
Huang, Honda ; Yang, Jiuun-Jer ; Yu, Ta-Lee ; Young, Konrad ; Chiu, Kuang-Yi
fYear :
1997
fDate :
3-5 June 1997
Firstpage :
321
Lastpage :
324
Keywords :
Condition monitoring; Current measurement; Degradation; Electrical resistance measurement; Hot carriers; Industrial electronics; MOSFET circuits; Power supplies; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
ISSN :
1524-766X
Print_ISBN :
0-7803-4131-7
Type :
conf
DOI :
10.1109/VTSA.1997.614921
Filename :
614921
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3291874
بازگشت