• DocumentCode
    3291874
  • Title

    Hot Carrier Reliability Considerations For High Performance Submicron Mosfet´s

  • Author

    Huang, Honda ; Yang, Jiuun-Jer ; Yu, Ta-Lee ; Young, Konrad ; Chiu, Kuang-Yi

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    321
  • Lastpage
    324
  • Keywords
    Condition monitoring; Current measurement; Degradation; Electrical resistance measurement; Hot carriers; Industrial electronics; MOSFET circuits; Power supplies; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614921
  • Filename
    614921
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3291874