DocumentCode :
3292395
Title :
Bowtie nanoantennas with void defects
Author :
Kebo He ; Ji Chen ; Zhaoyu Zhang
Author_Institution :
Shenzhen Grad. Sch., Sch. of Comput. & Inf. Eng., Peking Univ., Shenzhen, China
fYear :
2012
fDate :
13-16 Dec. 2012
Firstpage :
1
Lastpage :
3
Abstract :
The surface plasmon resonance (SPR) modes and near field gap enhancement of bowtie nanoantennas with void defects are studied numerically. According to the location of the defects, we classify them into four categories: inner, edge, base and vertex defects. Inner and base defects have little impact on SPR modes and gap enhancement while edge and vertex defects lead to mode splitting and gap enhancement changing because of the symmetry breaking. When defects on the edge getting closer to the gap, the gap enhancement increases even above that of the bowtie with no defects. These properties are useful for the evaluation of bowtie nanoantennas fabrication. Furthermore, we can extend the control of the defect location to the defect properties to get useful resonant modes and increase the gap enhancement in applications such as broadband light harvesting, ultrafast wavelength-sensitive photodetection and fluorescent detection for two or more targets.
Keywords :
antennas; nanophotonics; optical fabrication; surface plasmon resonance; voids (solid); base defects; bowtie nanoantenna fabrication; broadband light harvesting; defect location; edge defects; fluorescent detection; inner defects; near field gap enhancement; surface plasmon resonance modes; symmetry breaking; ultrafast wavelength-sensitive photodetection; vertex defects; void defects; Antennas; Biomedical optical imaging; Educational institutions; Optical device fabrication; Optical surface waves; Plasmons; Silver; bowtie nanoantennas; surface plasmon resonance; void defects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Global Conference (PGC), 2012
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2513-4
Type :
conf
DOI :
10.1109/PGC.2012.6458105
Filename :
6458105
Link To Document :
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