DocumentCode :
3292510
Title :
Quantum confinement effects in semiconducting scintillators
Author :
Shibuya, Kengo ; Inadama, Naoko ; Yoshida, Eiji ; Yamaya, Taiga ; Murayama, Hideo ; Koshimizu, Masanori ; Asai, Keisuke
Author_Institution :
Dept. of Medical Phys., Nat. Inst. of Radiol. Sci., Chiba
Volume :
3
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
1503
Lastpage :
1507
Abstract :
A physical method to develop a scintillator with both a large light output and a quick response is proposed and demonstrated. A direct-gap semiconductor often exhibits ultrafast scintillation components with subnanosecond decay time constants at very low temperatures. However, the exciton luminescence is significantly quenched at room temperature to lose the practical merits. The authors found that the thermal quenching was effectively prevented by constructing a low-dimensional quantum confinement system and a practical amount of light output was obtained at room temperature without losing the quickness of the radiative recombination of the exciton. Crystals of (C6H13NH3)2 PbI4 having a multiple quantum well structure exhibited three decay components of 390 ps, 3.8 ns and 16 ns with the ratios of 28%, 29% and 43%, respectively. The total light output at 300 K was 11% of that of NaI:Tl
Keywords :
excitons; luminescence; quantum well devices; quenching (thermal); scintillation; semiconductor counters; solid scintillation detectors; (C6H13NH3)2PbI4 crystals; 16 ns; 3.8 ns; 390 ps; direct-gap semiconductor; exciton luminescence; low-dimensional quantum confinement system; multiple quantum well structure; radiative recombination; semiconducting scintillators; subnanosecond decay time constants; thermal quenching; ultrafast scintillation components; Excitons; Ionizing radiation; Luminescence; Photonic crystals; Positron emission tomography; Potential well; Radiative recombination; Semiconductivity; Temperature; Thermal quenching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596604
Filename :
1596604
Link To Document :
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