DocumentCode :
32926
Title :
Thermal Nonlinearities in Contour Mode AlN Resonators
Author :
Segovia-Fernandez, Jeronimo ; Piazza, Gianluca
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
22
Issue :
4
fYear :
2013
fDate :
Aug. 2013
Firstpage :
976
Lastpage :
985
Abstract :
In this paper, we analyze the origin of elastic nonlinearities in aluminium nitride contour mode resonators (CMRs). Our study highlights that the nonlinear behavior is due to thermal effects when the resonators are electrically excited and the input is slowly (slow with respect to the device thermal time constant) swept through the excitation frequencies close to the main resonance. An analytical expression that relates the nonlinear behavior of the device to its geometry and material properties is derived. Amplitude-frequency (A-f) and third-order intermodulation (IMD3) measurements on 1-GHz AlN CMRs are employed to demonstrate the theoretical reasoning. The two experiments confirm the validity of the analytical derivation when the system is dominated by thermally induced nonlinearities. In the case of large frequency difference between the modulation frequencies, purely elastic nonlinearity can also be extracted from the IMD3 measurements.
Keywords :
aluminium compounds; intermodulation distortion; resonators; AlN; IMD3; amplitude-frequency measurements; contour mode resonators; elastic nonlinearities; frequency 1 GHz; thermal effects; thermal nonlinearities; thermal time constant; thermally induced nonlinearities; third-order intermodulation measurements; Amplitude-frequency; contour mode AlN resonator; duffing equation; lumped electrical mode; thermal nonlinear effect; third-order intermodulation distortion;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2013.2252422
Filename :
6507328
Link To Document :
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