DocumentCode :
3292612
Title :
Enhanced field emission from polysilicon emitters using porous silicon
Author :
Pullen, S.E. ; Huang, M. ; Huq, S.E. ; Boswell, E.C. ; Prewett, P.D. ; Smith, G.D.W. ; Wilshaw, P.R.
Author_Institution :
Dept. of Mater., Oxford Univ., UK
fYear :
1996
fDate :
7-12 Jul 1996
Firstpage :
211
Lastpage :
214
Abstract :
It is now well known that the field emission performance of single crystal silicon field emitters is improved by the formation of porous silicon on their surface. However, single crystal based displays are likely to be expensive and difficult to scale up. Displays based on polysilicon would have advantages in both of these respects. We now report the first observation of enhanced field emission from porous silicon on polysilicon emitters. Both wet and dry etching processes were used to produce emitters on n and p type polysilicon. Porous silicon was then formed by anodisation. Field emission characterisation after the anodisation shows a significant starting voltage reduction of 40-50% in each of the samples tested
Keywords :
anodisation; electron field emission; elemental semiconductors; etching; porous materials; silicon; Si; anodisation; display; dry etching; field emission; polysilicon emitter; porous silicon; starting voltage; wet etching; Chemical vapor deposition; Crystal microstructure; Dry etching; Fabrication; Flat panel displays; Glass; Optical buffering; Silicon; Voltage; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
Type :
conf
DOI :
10.1109/IVMC.1996.601809
Filename :
601809
Link To Document :
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