• DocumentCode
    3292887
  • Title

    SOI Low Power I.model For Analog And Digital Circuits Calibrated Using Virtual Wafer Fab

  • Author

    Lai, J.C. ; Yue, J. ; Beaudoin, K.P.

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    334
  • Lastpage
    338
  • Keywords
    Charge carrier processes; Digital circuits; Diodes; Electron mobility; Impact ionization; Large Hadron Collider; MOS devices; Semiconductor device modeling; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614926
  • Filename
    614926
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3292887