Title :
MESFETs on H-terminated polycrystalline diamond
Author :
Calvani, P. ; Sinisi, F. ; Rossi, M.C. ; Conte, G. ; Giovine, E. ; Ciccognani, W. ; Limiti, E.
Author_Institution :
Electron. Eng. Dept., Univ. of Roma Tre, Rome
Abstract :
Metal-Semiconductor Field Effect Transistors (MESFETs) were fabricated on polycrystalline diamond. Devices were realized to be employed in Microwave Integrated Circuits for satellite communications and high frequency power amplification, areas were diamond promise the replacement of vacuum electronics. Fabricated MESFETs typically showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut off frequency ft=10 GHz and a maximum oscillation frequency, fmax, up to 35 GHz. These values suggest device microwave operation and are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies.
Keywords :
Schottky gate field effect transistors; semiconductor device manufacture; wide band gap semiconductors; H-terminated; MESFET; polycrystalline diamond; wide band semiconductors; Fabrication; Frequency; Geometry; MESFETs; Microelectronics; Microwave FET integrated circuits; Microwave devices; Microwave integrated circuits; Satellite communication; Transconductance; carbon based electronics; device technology; diamond; electrical characteristics; semiconductor devices; wide band semiconductors;
Conference_Titel :
Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
Conference_Location :
Aachen
Print_ISBN :
978-1-4244-3704-7
DOI :
10.1109/ULIS.2009.4897585