Title :
New Weighted Time Lag Method for the Analysis of Random Telegraph Signals
Author :
Martin-Martinez, J. ; Diaz, J. ; Rodriguez, Roberto ; Nafria, M. ; Aymerich, X.
Author_Institution :
Dept. of Electron. Eng., Univ. Autonoma de Barcelona, Bellaterra, Spain
Abstract :
A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant.
Keywords :
MOSFET; Monte Carlo methods; random noise; semiconductor device noise; Monte Carlo generated RTS traces; background noise; pMOS transistor; random telegraph signals; weighted time lag method; Histograms; MOSFET; Monte Carlo methods; Noise; Noise measurement; Parameter extraction; Standards; CMOS; Random telegraph signals; characterization; noise; parameter extraction;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2304673
