Title :
Improved independent component regression modeling
Author :
Zhao, Chunhui ; Gao, Furong ; Liu, Tao ; Wang, Fuli
Author_Institution :
Dept. of Chem. & Biomol. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
The conventional independent component regression (ICR), as an exclusive two-step implementation algorithm, has the risk similar to principal component regression (PCR). That is, the extracted independent components (ICs) are not guaranteed to be informative with respect to quality prediction and interpretation. Moreover, it inherits some inconveniences of conventional ICA. In this paper, first, the drawbacks of original ICR are analyzed. Then a modified ICR (M-ICR) modeling algorithm is developed. To enhance the causal relationship between the extracted ICs and quality variables, a dual-objective optimization solution is constructed in the first-step feature extraction modeling. It simultaneously considers two-fold statistical requirements, the independence and quality-correlation. Moreover, their different roles in calibration modeling can be quantitatively evaluated by flexibly adjusting the sub-optimization objective weights. The practicability and performance of M-ICR are illustrated and discussed in simulation experiment.
Keywords :
feature extraction; independent component analysis; optimisation; principal component analysis; regression analysis; causal relationship; dual-objective optimization; first-step feature extraction modeling; independent component regression; modified ICR modeling algorithm; principal component regression; quality correlation; quality variable; suboptimization objective weights; two-fold statistical requirement; Calibration; Chemical analysis; Chemical technology; Data mining; Feature extraction; Gaussian distribution; Independent component analysis; Predictive models; Principal component analysis; Statistical analysis;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5399563