• DocumentCode
    3293737
  • Title

    Combining influential analysis of bonding temperature and power on bonding quality

  • Author

    Zhang, Yanan ; Han, Lei

  • Author_Institution
    Coll. of Mech. & Electr. Eng., Central South Univ., Changsha, China
  • fYear
    2009
  • fDate
    6-10 July 2009
  • Firstpage
    503
  • Lastpage
    506
  • Abstract
    The bonding quality as obtained by strength tests of thermosonic bonding has been investigated as function of bonding temperature and ultrasonic power. The results show that bonding quality is very sensitive to process temperature and power. Optimum bonding temperature is not identical at different ultrasonic power. Analogously, optimum ultrasonic power which appears between 0.36 W and 0.95 W is not identical at different bonding temperature. The success rate of bonding is nearly 100% except for bonding temperature of 50degC and ultrasonic power of 0.035 W. Meanwhile, their match is important. The combining influence of bonding temperature and power on bonding quality is analyzed by the interpolation of mean strength. The obtained data were useful for further researches.
  • Keywords
    integrated circuit bonding; interpolation; tape automated bonding; bonding quality; bonding temperature; interpolation; mean strength; strength tests; thermosonic bonding; ultrasonic power; Aluminum; Bonding forces; Bonding processes; Educational institutions; Gold; Microelectronics; Packaging; Temperature sensors; Ultrasonic variables measurement; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
  • Conference_Location
    Suzhou, Jiangsu
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4244-3911-9
  • Electronic_ISBN
    1946-1542
  • Type

    conf

  • DOI
    10.1109/IPFA.2009.5232597
  • Filename
    5232597