Title :
Impact of simulation parameters on critical area analysis
Author :
Segal, Julie ; Bakarian, Sergei ; Ross, Ron
Author_Institution :
HPL Inc., San Jose, CA, USA
Abstract :
Monte Carlo critical area extraction routines are controlled by a number of parameters that impact the accuracy and speed of the simulation. In this paper, the effects of the following parameters are explored experimentally: defect shape, rounding of corners in the layout, merging of redundant contacts, consideration of the netlist extracted from layout, and varying the number of defects simulated
Keywords :
Monte Carlo methods; circuit layout CAD; circuit simulation; integrated circuit layout; integrated circuit yield; redundancy; Monte Carlo extraction routines; corner rounding; critical area analysis; defect shape; netlist; redundant contacts; simulation accuracy; simulation parameters; simulation speed; Analytical models; Data mining; Geometry; Instruments; Integrated circuit layout; Integrated circuit yield; Merging; Radio access networks; Random access memory; Shape;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0325-x
DOI :
10.1109/DFTVS.1999.802864
