DocumentCode :
3294131
Title :
Framework for Event Driven Sorter Operation
Author :
Tamehiro, Ryuji ; Herbold, Barry M. ; Gartland, Karl E. ; Liang, Frank
Author_Institution :
IBM Japan Ind. Solution Co. Ltd., Kyoto
fYear :
2006
fDate :
25-27 Sept. 2006
Firstpage :
253
Lastpage :
256
Abstract :
Recently most manufacturing operations in FAB are done in automated manner. Following the predefined process routing information, every lot is automatically dispatched, transported, and processed by manufacturing execution system (MES). However all kinds of wafer sorting operation cannot be predefined in the route because unplanned wafer sorting is required according to the process result, condition of process equipment, or other reason. This paper describes concerns to automate sorter operation and proposes the framework to cover both planned and unplanned sorter operation in the same automated manner with event driven base.
Keywords :
electronics industry; factory automation; integrated circuit manufacture; materials handling; semiconductor technology; event driven sorter operation; manufacturing execution system; process routing information; sorter operation automation; wafer sorting operation; Automatic control; Control systems; Dispatching; Information retrieval; Manufacturing automation; Manufacturing industries; Manufacturing processes; Process control; Routing; Sorting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
ISSN :
1523-553X
Print_ISBN :
978-4-9904138-0-4
Type :
conf
DOI :
10.1109/ISSM.2006.4493076
Filename :
4493076
Link To Document :
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