• DocumentCode
    3294155
  • Title

    Support Vector based Demand Forecasting for Semiconductor Manufacturing

  • Author

    Chittari, Prasanna ; Raghavan, N. R Srinivas

  • Author_Institution
    Intel, Bangalore
  • fYear
    2006
  • fDate
    25-27 Sept. 2006
  • Firstpage
    261
  • Lastpage
    264
  • Abstract
    Accurate demand forecasting is the key capability for manufacturing organization, more so, a semiconductor manufacturer. Many crucial decisions are based on demand forecasts. In this paper, we apply support vector regression (v -SVR) with our three phased approach for modeling input vector to enhance forecasting accuracy and compare its results with other baseline forecasting techniques. Since support vector machines (SVM) have greater generalization ability and guaranteed global minima for given training data, it is believed that SVR will perform well for time series analysis. Compared to other demand forecasting techniques, our results show that the SVR can significantly reduce both mean absolute percentage errors and normalized mean-squared errors of forecasts. We demonstrate the feasibility of applying SVR in semiconductor demand forecasting and prove that SVR is applicable and performs well for semiconductor demand data analysis.
  • Keywords
    demand forecasting; mean square error methods; production engineering computing; regression analysis; semiconductor device manufacture; support vector machines; mean absolute percentage errors; normalized mean-squared errors; semiconductor demand data analysis; semiconductor demand forecasting; semiconductor manufacturing; support vector based demand forecasting; support vector machines; support vector regression; Demand forecasting; Economic forecasting; Marketing and sales; Performance analysis; Predictive models; Semiconductor device manufacture; Space technology; Support vector machines; Time series analysis; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-4-9904138-0-4
  • Type

    conf

  • DOI
    10.1109/ISSM.2006.4493078
  • Filename
    4493078