• DocumentCode
    3294311
  • Title

    The irradiation effect and failure analysis of DC-DC power converter

  • Author

    He Yujuan ; En YunFei ; Luo Hongwei ; He Xiaoqi

  • Author_Institution
    Res. & Anal. Center, China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
  • fYear
    2009
  • fDate
    6-10 July 2009
  • Firstpage
    385
  • Lastpage
    387
  • Abstract
    The irradiation response of a DC-DC power converter was studied. During the test, the characteristic parameter of DC-DC power converter such as input current and output voltage increased slowly with empty load, and DC-DC power converter was unsteady and the characteristic parameter was strongly influenced by the total-dose when fully loaded. It was indicated that failure of DC-DC converter was due to the source and drain of VDMOSFET fused together because of over power.
  • Keywords
    DC-DC power convertors; MOSFET; failure analysis; radiation effects; DC-DC power converter; VDMOSFET; failure analysis; irradiation effect; Circuit testing; DC-DC power converters; Failure analysis; Helium; MOSFET circuits; Optical amplifiers; Optical feedback; Power MOSFET; Pulse width modulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
  • Conference_Location
    Suzhou, Jiangsu
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4244-3911-9
  • Electronic_ISBN
    1946-1542
  • Type

    conf

  • DOI
    10.1109/IPFA.2009.5232625
  • Filename
    5232625