DocumentCode :
3294336
Title :
Design and synthesis of low power weighted random pattern generator considering peak power reduction
Author :
Zhang, Xiaodong ; Roy, Kaushik
Author_Institution :
Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
1999
fDate :
36465
Firstpage :
148
Lastpage :
156
Abstract :
In order to meet the power and reliability constraints, it is important to reduce average power and peak power during test. In this paper we propose a Low Power Automatic Test Pattern Generator (LPATPG), which can be used during online testing of large circuits requiring low power dissipation. The LPATPG can be implemented by linear cellular automata (CA) with appropriate external weighting logic. While the average power is reduced by finding the optimal signal activities (probabilities of signal switching) at the primary inputs, the peak power is reduced by finding the best initial conditions in the CA cells. Results on ISCAS benchmark circuits show that average power reduction of up to 79.7%, peak power reduction of up to 39.2% and energy reduction of up to 84.4% can be achieved (compared to linear cellular automata) while achieving high fault coverage
Keywords :
VLSI; automatic test pattern generation; built-in self test; cellular automata; circuit CAD; integrated circuit design; integrated circuit testing; logic CAD; logic testing; low-power electronics; probability; programmable circuits; CAD; CASYN tool; VLSI circuit testing; automatic test pattern generator; external weighting logic; high fault coverage; large circuits; linear cellular automata; low power ATPG; low power test pattern generator; online testing; optimal signal activities; peak power reduction; signal switching probability; weighted random pattern generator; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Logic testing; Packaging; Power generation; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location :
Albuquerque, NM
ISSN :
1550-5774
Print_ISBN :
0-7695-0325-x
Type :
conf
DOI :
10.1109/DFTVS.1999.802880
Filename :
802880
Link To Document :
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