• DocumentCode
    3294336
  • Title

    Design and synthesis of low power weighted random pattern generator considering peak power reduction

  • Author

    Zhang, Xiaodong ; Roy, Kaushik

  • Author_Institution
    Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1999
  • fDate
    36465
  • Firstpage
    148
  • Lastpage
    156
  • Abstract
    In order to meet the power and reliability constraints, it is important to reduce average power and peak power during test. In this paper we propose a Low Power Automatic Test Pattern Generator (LPATPG), which can be used during online testing of large circuits requiring low power dissipation. The LPATPG can be implemented by linear cellular automata (CA) with appropriate external weighting logic. While the average power is reduced by finding the optimal signal activities (probabilities of signal switching) at the primary inputs, the peak power is reduced by finding the best initial conditions in the CA cells. Results on ISCAS benchmark circuits show that average power reduction of up to 79.7%, peak power reduction of up to 39.2% and energy reduction of up to 84.4% can be achieved (compared to linear cellular automata) while achieving high fault coverage
  • Keywords
    VLSI; automatic test pattern generation; built-in self test; cellular automata; circuit CAD; integrated circuit design; integrated circuit testing; logic CAD; logic testing; low-power electronics; probability; programmable circuits; CAD; CASYN tool; VLSI circuit testing; automatic test pattern generator; external weighting logic; high fault coverage; large circuits; linear cellular automata; low power ATPG; low power test pattern generator; online testing; optimal signal activities; peak power reduction; signal switching probability; weighted random pattern generator; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Logic testing; Packaging; Power generation; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0325-x
  • Type

    conf

  • DOI
    10.1109/DFTVS.1999.802880
  • Filename
    802880