Yield Methodology for Mixed Signal Process Development

Develop for yield is a key component in our technology development methodology in the mixed signal technology development (MSTD) organization of Texas Instruments. Relying on a comprehensive set of integrated yield monitors (IYMs) and DDSRAM, we begin our yield learning as early as process definition phase. The yield activity evolves together with component development, process integration and design rule formation. Yield issues are identified through systematic data reduction of test results and FA. On average, 4 to 6 major yield issues are found on each new technology prior to ramp. The methodology has typically resulted in a 6-12 month acceleration in yield learning.