DocumentCode :
3294595
Title :
The feedback technology for gain flatness and stability of UWB LNA
Author :
Donghui Zhang ; Wanrong Zhang ; Dongyue Jin ; Hongyun Xie ; Xin Zhao ; Boyyu Liu ; Yongqiang Zhou
Author_Institution :
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
fYear :
2011
fDate :
15-17 April 2011
Firstpage :
6260
Lastpage :
6263
Abstract :
In this paper, based on small signal models of hetero-junction bipolar transistors (HBTs) with different feedback circuits, the expressions for S parameters of the device are derived to analyze the influence of different feedback technologies on amplifier performance, especially on the stability and the gain flatness of Ultra-Wideband Low Noise Amplifier(UWB LNA). When a serial inductor or a parallel capacitor is added into the feedback circuits to induce reactive feedback, the amplitude of S21 increases as the frequency increases, the HBT´s gain inherent decreasing at high frequency is compensated, a good stability performance can also be reached simultaneously. Based on reactive feedback techniques, we design a 3GHz-10GHz UWB LNA. The simulation results show that throughout the whole frequency band, the amplifier remains unconditionally stable, has a high transmission gain, good gain flatness and low noise figure.
Keywords :
S-parameters; capacitors; circuit feedback; circuit stability; feedback amplifiers; heterojunction bipolar transistors; inductors; low noise amplifiers; microwave amplifiers; ultra wideband technology; HBT; S parameter expression; UWB LNA stability; feedback circuit technology; frequency 3 GHz to 10 GHz; frequency compensated; gain flatness; heterojunction bipolar transistor; inductor; parallel capacitor; reactive feedback technique; ultra-wideband low noise amplifier stability; Capacitors; Circuit stability; Feedback circuits; Heterojunction bipolar transistors; Inductors; Stability analysis; Gain flatness; Low noise amplifier; Reactive feedback; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
Type :
conf
DOI :
10.1109/ICEICE.2011.5778384
Filename :
5778384
Link To Document :
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